HO, Cuong Manh; 						VU, Yem Van.
 A Novel Method Based on Two Different Thicknesses of The Sample for Determining Complex Permittivity of Materials Using Electromagnetic Wave Propagation in Free Space at X-Band.
<strong>VNU Journal of Science: Computer Science and Communication Engineering</strong>, [S.l.], v. 33, n. 1, oct. 2017.
ISSN 2588-1086.
Available at: &lt;<a href="//jcsce.vnu.edu.vn/index.php/jcsce/article/view/158" target="_new">//jcsce.vnu.edu.vn/index.php/jcsce/article/view/158</a>&gt;. Date accessed: 20 nov. 2024.
doi: <a href="https://doi.org/10.25073/2588-1086/vnucsce.158">https://doi.org/10.25073/2588-1086/vnucsce.158</a>.