Ho, Cuong, & Yem Van Vu.
" A Novel Method Based on Two Different Thicknesses of The Sample for Determining Complex Permittivity of Materials Using Electromagnetic Wave Propagation in Free Space at X-Band." <em>VNU Journal of Science: Computer Science and Communication Engineering</em> [Online], 33.1 (2017): n. pag. Web. 20 Nov. 2024